The ISL70321SEH and ISL73321SEH are radiation hardened and SEE mitigated power supply sequencers designed to drive Point-of-Load (POL) regulators with enable pins. Up to four power supplies can be fully sequenced by a single device or multiple devices can be easily cascaded to sequence an unlimited number of power supplies for dense RF applications. This power supply sequencer requires only two feedback resistors per power supply and a single resistor to set the rising and falling delay. The device features precision input comparators with an input threshold voltage of 600mV ±1.5% for the highest possible accuracy when monitoring the power supply voltages. The ISL70321SEH and ISL73321SEH are offered in an 18 Ld 10mm x 12mm CDFP package or die form and are fully specified across the military ambient temperature range of -55 °C to +125 °C. With minimal external component count, precision voltage monitoring, and SET mitigation, the ISL70321SEH and ISL73321SEH are the ideal choice to control many of today’s highly dense power systems in high-reliability applications.

特長

  • Wide operating voltage range, 3V to 13.2V
  • Single resistor sets the rising and falling delay
  • Power-off POLs in reverse order or simultaneously
  • Precision voltage monitoring
  • 600mV ±1.5% threshold voltage over temperature and radiation
  • Full military temperature range operation
  • TA = -55 °C to +125 °C
  • TJ = -55 °C to +150 °C
  • Radiation hardness
  • High dose rate (HDR) (50-300rad(Si)/s): 100krad(Si) - ISL70321SEH only
  • Low dose rate (LDR) (0.01rad(Si)/s): 75krad(Si) ISL70321SEH and ISL73321SEH
  • SEE hardness (Review SEE report for details)
  • No SEB/SEL LETTH, VDD = 14.7V: 86MeV•cm2/mg
  • SET, SEFI free at LET 20MeV•cm2/mg
  • Electrically screened to DLA SMD 5962-17225

descriptionドキュメント

タイトル language 分類 形式 サイズ 日付
star ISL70321SEH, ISL73321SEH Datasheet データシート PDF 1.12 MB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
Ensuring Power Supply Sequencing in Spaceflight Systems ホワイトペーパー PDF 547 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
PCN18008 - Part Marking Change for the Listed QML Products 製品変更通知 PDF 846 KB
Intersil Space Products Brochure カタログ PDF 3.16 MB
Intersil Commercial Lab Services カタログ PDF 364 KB
Standard Microcircuit Drawing 5962-17225 (ISL70321SEH, ISL73321SEH) その他資料 0 KB
ISL70321SEH, ISL73321SEH SEE Test Report レポート PDF 477 KB
ISL73321SEH Total DoseTest Report レポート PDF 315 KB

printニュース&各種リソース

分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月26日
Standard Data Package 基本ページ 2020年3月20日
Rad Hard SMD Test Flow 基本ページ 2020年3月20日
Rad Hard Test Reports 基本ページ 2020年3月20日