Support is limited to customers who have already adopted these products.

The ISL75051SEH, ISL75051SRH are radiation hardened low-voltage, high-current, single-output LDOs specified for up to 3. 0A of continuous output current. These devices operate over an input voltage range of 2. 2V to 6. 0V and are capable of providing output voltages of 0. 8V to 5. 0V adjustable, based on resistor divider setting. Dropout voltages as low as 65mV can be realized using the device. The OCP pin allows the short-circuit output current limit threshold to be programmed by means of a resistor from the OCP pin to GND. The OCP setting range is from 0. 5A minimum to 8. 5A maximum. The resistor sets the constant current threshold for the output under fault conditions. The thermal shutdown disables the output if the device temperature exceeds the specified value. It subsequently enters an ON/OFF cycle until the fault is removed. The ENABLE feature allows the part to be placed into a low current shutdown mode that typically draws about 1μA. These devices are optimized for fast transient response and single event effects. This reduces the magnitude of SET seen on the output. Additional protection diodes and filters are not needed. These devices are stable with tantalum capacitors as low as 47μF and provide excellent regulation all the way from no load to full load. Programmable soft-start allows the user to program the inrush current by means of the decoupling capacitor value used on the BYP pin.


  • DLA SMD 5962-11212
  • Output current up to 3.0A at TJ = +150°C
  • Output accuracy ±1.5% over MIL temperature range
  • Ultra low dropout:
  • 65mV (typical) dropout at 1.0A
  • 225mV (typical) dropout at 3.0A
  • SET mitigation with no added filtering/diodes
  • Input supply range: 2.2V to 6.0V
  • Fast load transient response
  • Shutdown current of 1μA (typical)
  • Output adjustable using external resistors
  • PSRR 66dB (typical) at 1kHz
  • Enable and PGood feature
  • Programmable soft-start/inrush current limiting
  • Over-temperature shutdown and programmable OCP limits
  • Stable with 47μF min tantalum capacitor
  • Radiation environment
  • High dose rate (50-300rad(Si)/s): 100krad(Si)
  • Low dose rate (0.01rad(Si)/s): 100krad(Si)*
    *Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50 krad(Si) at low dose rate.


  • LDO regulator for space application
  • DSP, FPGA and µP core power supplies
  • Post-regulation of switched mode power supplies
  • Down-hole drilling


タイトル language 分類 形式 サイズ 日付
star ISL75051SEH, ISL75051SRH Datasheet データシート PDF 947 KB
VIRTEX5MEZPWREV1Z User Guide マニュアル-開発ツール PDF 1.32 MB
ISL75051SRHEVAL1Z マニュアル-開発ツール PDF 916 KB
AN1947: Intersil's Radiation Hardened Low Power FPGA Power Solutions アプリケーションノート PDF 304 KB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
PAN17022 - Product Alert - ISL75051* / 5962-11212 RH Linear Regulator Product Alert Notice PDF 235 KB
PLC18009 - Q2 Standard EOL Notice Product Life Cycle Notice PDF 345 KB
Intersil Space Products Brochure カタログ PDF 3.16 MB
Intersil Commercial Lab Services カタログ PDF 364 KB
Standard Microcircuit Drawing 5962-11212 (ISL75051SEH, ISL75051SRH, ISL75051ASEH, ISL73051ASEH) その他資料 0 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report レポート PDF 328 KB
ISL75051SEH Total Dose Test Report レポート PDF 325 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report with Boeing レポート PDF 308 KB
ISL75051SRH SEE Test Report レポート PDF 1.28 MB
TB499: PCB Thermal Land Design for Ceramic Packages with Bottom Metal or Heat Sinks 技術概要 PDF 410 KB


タイトル language 分類 形式 サイズ 日付
ISL75051SRH-ISL73051ASEH PSPICE Model Model - Other ZIP 7 KB
Artwork files for the VIRTEX5MEZPWREV1Z Evaluation Board PCB設計ファイル ZIP 328 KB
ISL75051SRHEVAL1Z Design Files PCB設計ファイル ZIP 275 KB
Schematics for the VIRTEX5MEZPWREV1Z Evaluation Board PCB設計ファイル PDF 98 KB
VIRTEX5MEZPWREV1Z Bill of Materials PCB設計ファイル XLS 38 KB


分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月26日
Standard Data Package 基本ページ 2020年3月20日
Rad Hard SMD Test Flow 基本ページ 2020年3月20日
Rad Hard Test Reports 基本ページ 2020年3月20日