旧インターシルの耐放射線アナログICは、性能を最適化し、システムのSWaP(サイズ、重量、消費電力)コストを削減し、航空宇宙および過酷環境向けアプリケーションの市場投入までの時間を短縮するように設計されています。
年4回発行のRAD HARDニュースレターにご登録いただくと、ルネサスの最新の耐放射線特性製品情報やリソース情報をお届けします。
ルネサスの耐放射線強化アナログ向けポートフォリオは、クラス最高の性能、システムSWAPコストの削減、市場投入までの時間の短縮を目指します。 ルネサスは、衛星通信や宇宙飛行システムなど、幅広い宇宙アプリケーションに適合する高信頼性、高効率、高精度の耐放射線強化製品を提供してきた比類なき実績があります。
低線量率イオン化照射が半導体に与える影響は、宇宙アプリケーションにとって重要な課題となっています。 Renesasは、現状の高線量率耐性試験に対する補完としてウエハごとの低線量率耐性試験を行なうことにより、この市場に対応しています。
Renesasは、数社しかないRHA国防補給庁(陸および海) QMLサプライヤの1社です。 ルネサスの耐放射線強化SMD製品はすべてMIL-PRF-38535/QMLに準拠し、バーンイン試験に100%合格しています。
サブカテゴリ |
Temp. Range |
Pkg. Type |
Lead Count (#) |
Pkg. Dimensions (mm) |
Price (USD) | 1ku |
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型名 | ||||||
Single 16/Differential 8 Channel CMOS Analog Multiplexer with Active Overvoltage Protection | Rad Hard Multiplexers | -55 to +125°C | SBDIP | 28 | 35.6 x 15.1 x 2.41 | |
Single 16/Differential 8 Channel CMOS Analog Multiplexer with Active Overvoltage Protection | Rad Hard Multiplexers | -55 to +125°C | SBDIP | 28 | 35.6 x 15.1 x 2.41 | |
Single 8/Differential 4 Channel CMOS Analog Multiplexer with Active Overvoltage Protection | Rad Hard Multiplexers | -55 to +125°C | SBDIP | 16 | 20.3 x 7.5 x 2.41 | |
High Speed, Low Power Output Limiting, Closed-Loop-Buffer Amplifier | Rad Hard Buffers | -55 to +125°C | SBDIP | 8 | 9.9 x 7.5 x 2.41 | |
Current Feedback Amp W/VIO Adjust | Rad Hard Op Amps | -55 to +125°C | CFP, DIE, SBDIP | 8, 14 | 9.5 x 6.3 x 0.00, 9.9 x 7.5 x 2.41 | |
Video Op-Amp With Output Disable | Rad Hard Op Amps | -55 to +125°C | SBDIP | 8 | 9.9 x 7.5 x 2.41 | |
Radiation Hardened Quad Voltage Comparator | Rad Hard Comparators | -55 to +125°C | CFP, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Radiation Hardened Quad Voltage Comparator | Rad Hard Comparators | -55 to +125°C | CFP, DIE, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, SBDIP | 28 | 18.3 x 12.7 x 0.00, 35.6 x 15.1 x 2.41 | |
Rad-Hard 16 Channel BiCMOS Analog Multiplexer with High-Z Analog Input Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, DIE, SBDIP | 28 | 15 x 36 x 5.89, 18.3 x 12.7 x 0.00, 35.6 x 15.1 x 2.41 | |
Rad-Hard 16 Channel BiCMOS Analog Multiplexer with High-Z Analog Input Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, DIE, SBDIP | 28 | 18.3 x 12.7 x 0.00, 35.6 x 15.1 x 2.41 | |
Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, SBDIP | 28 | 18.3 x 12.7 x 0.00, 35.6 x 15.1 x 2.41 | |
Radiation Hardened High Speed, Quad SPST, CMOS Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened High Speed, Quad SPST, CMOS Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Fast Sample and Hold | Rad Hard Sample and Hold | -55 to +125°C | SBDIP | 14 | 19.0 x 7.4 x 2.41 | |
Radiation Hardened Quad Differential Line Driver | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Driver | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Quad, 5.0V Differential Line Driver, CMOS Enable Class T Datasheet | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 7 x 10 x 2.92, 7 x 20 x 5.08 | |
Radiation Hardened Quad Differential Line Receiver | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Receiver | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Quad Differential Line Receiver | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 7 x 10 x 2.92, 7 x 20 x 5.08 | |
Radiation Hardened 3.3V Quad Differential Line Drivers | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened 3.3V Quad Differential Line Drivers | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened 3.3V Quad Differential Line Receiver | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened 3.3V Quad Differential Line Receiver | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Drivers | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Drivers | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 7 x 10 x 2.92, 7 x 20 x 5.08, 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Receivers | Rad Hard Interface | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened Quad Differential Line Receivers | Rad Hard Interface | -55 to +125°C | CFP, SBDIP | 16 | 7 x 10 x 2.92, 7 x 20 x 5.08, 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened BiCMOS Dual DPST Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, DIE | 14 | 9.9 x 6.6 x 0.00 | |
Radiation Hardened CMOS Dual SPDT Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Radiation Hardened CMOS Dual SPDT Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, DIE, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Radiation Hardened CMOS Dual SPDT Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, DIE, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Radiation Hardened CMOS Dual SPDT Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, SBDIP | 14 | 9.9 x 6.6 x 0.00, 17.8 x 7.5 x 2.41 | |
Radiation Hardened BiCMOS Dual SPDT Analog Switch | Rad Hard Switches | -55 to +125°C | CFP, DIE | 14 | 9.9 x 6.6 x 0.00 | |
Radiation Hardened Programmable Low Power Op Amps | Rad Hard Op Amps | -55 to +125°C | CAN, CFP, DIE | 8, 10 | 0.0 x 9.1 x 0.00, 6.5 x 6.5 x 0.00 | |
Radiation Hardened Programmable Low Power Op Amps | Rad Hard Op Amps | -55 to +125°C | CAN, CFP | 8, 10 | 0.0 x 9.1 x 0.00, 6.5 x 6.5 x 0.00 | |
Radiation Hardened 8 Channel CMOS Analog Multiplexer with Overvoltage Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened 8 Channel CMOS Analog Multiplexer with Overvoltage Protection | Rad Hard Multiplexers | -55 to +125°C | CFP, DIE, SBDIP | 16 | 10.4 x 6.9 x 0.00, 20.3 x 7.5 x 2.41 | |
Radiation Hardened, Low Noise Quad Operational Amplifiers | Rad Hard Op Amps | -55 to +125°C | CFP, DIE, SBDIP | 14 | 9.8 x 6.5 x 0.00, 19.0 x 7.4 x 2.41 | |
Radiation Hardened, Very Low Noise Quad Operational Amplifier | Rad Hard Op Amps | -55 to +125°C | CFP, DIE | 14 | 9.8 x 6.5 x 0.00 | |
Radiation Hardened 2.5V Reference | Rad Hard Voltage References | -55 to +125°C | CAN, CLCC, DIE | 3 | 0.0 x 5.4 x 0.00, 10.2 x 7.5 x 2.97 | |
Single Event Radiation Hardened Quad Voltage Comparators | Rad Hard Comparators | -55 to +125°C | CFP | 20 | 12.7 x 7.5 x 0.00 | |
Single Event Radiation Hardened Quad Voltage Comparators | Rad Hard Comparators | -55 to +125°C | CFP, DIE | 20 | 12.7 x 7.5 x 0.00 | |
Precision Dual Low Noise Operational Amplifiers | Rad Hard Op Amps | -55 to +125°C | CFP, DIE | 10 | 0.0 x 0.0 x 0.00, 6.5 x 6.5 x 0.00 | |
40V Precision Low Power Operational Amplifiers | Rad Hard Op Amps | -55 to +125°C | CFP, DIE | 14 | 9.8 x 6.5 x 0.00 | |
Radiation Hardened 40V High Side Current Sense Amplifiers | Rad Hard Current Sense Amplifiers | CFP | 10 | 0.0 x 0.0 x 0.00, 6.5 x 6.5 x 0.00 | ||
Radiation Hardened Dual 36V Precision Single-Supply, Rail-to-Rail Output, Low-Power Operational Amplifiers | Rad Hard Op Amps | -55 to +125°C | CFP | 10 | 0.0 x 0.0 x 0.00, 6.5 x 6.5 x 0.00 | |
Rad Hard Dual 36V Precision Single-Supply, Rail-to-Rail Output, Low-Power Operational Amplifiers | Rad Hard Op Amps | -55 to +125°C | CFP, DIE | 10 | 0.0 x 0.0 x 0.00, 6.5 x 6.5 x 0.00 | |
40V Radiation Hardened and SET Enhanced Precision Low Power Operational Amplifier | Rad Hard Op Amps | -55 to +125°C | CFP, DIE | 10 | 6.5 x 6.5 x 0.00 |
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分類 | タイトル | 日時 |
カタログ | PDF 4.85 MB | |
ホワイトペーパー | PDF 522 KB | |
ホワイトペーパー | PDF 438 KB | |
ホワイトペーパー | PDF 684 KB | |
ホワイトペーパー | PDF 352 KB | |
ホワイトペーパー | PDF 316 KB | |
ホワイトペーパー | PDF 362 KB | |
ホワイトペーパー | PDF 533 KB | |
8 items
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Over the past 19 years, the space industry has placed a higher value on understanding the effects that long-term, low dose radiation can have on ICs. Intersil's radiation testing specialist Nick van Vonno discusses why this shift has occurred and what we are doing to address this change.
There are many different types of radiation, and indeed Intersil addresses two of these. Intersil addresses total dose testing which is basically gamma rays. Okay, and at both high and low dose rate, as we'll get into later. Intersil also addresses single event effects of a fairly broad range, and those are typically addressed by heavy ion testing.
Low dose rate testing, you have to contrast this really in order to understand this. You have to look historically at how total dose testing which is done with gamma rays, how that's been performed. Historically this has been performed at what we call high dose rate, and typically to put this in some numbers, that would run somewhere in the range of 50rad to 300rad/s.
Low dose rate, on the other hand, is a much, much slower dose rate. The generally accepted number, and the one we perform our work in, is 0.01rad/s. You see how far that's away from 300rad a second. And that can also be expressed as 10mrad/s if you'd like.
Now why are we goofing with that? And the answer is that the low dose rate is what happens in space. Dose rates in space are almost uniformly low to the order of 10mrad/s. Low dose rate radiation testing has been a, let's call it a hot topic in silicon advanced research since about 1992, okay? In 1992, some researchers out at Mich research came up with a very unusual finding which showed that certain parts that looked very good at high dose rate degrade with amazing rapidity, orders and orders of magnitude, worse at low dose rate. And so, that was not a fully intuitive result, and indeed it had to be repeated, and in the intervening 19 years there is a very large amount of work that's been done on low dose rate effects. And, as we've learned about how different parts react in low dose rate, we've, as an industry, we've swung over more towards a low dose rate testing emphasis rather than a high dose rate testing emphasis.