The ISL78840ASEH, ISL78841ASEH, ISL78843ASEH, ISL78845ASEH, ISL78840ASRH, ISL78841ASRH, ISL78843ASRH, ISL78845ASRH are high-performance, radiation hardened drop-in replacements for the popular 28C4x and 18C4x PWM controllers suitable for a wide range of power conversion applications including boost, flyback and isolated output configurations. Fast signal propagation and output switching characteristics make these ideal products for existing and new designs. Features include up to 13.2V operation, low operating current, 90μA typical start-up current, adjustable operating frequency to 1MHz, and high peak current drive capability with 50ns rise and fall times.

特性

  • Electrically screened to DLA SMD # 5962-07249
  • QML qualified per MIL-PRF-38535 requirements
  • 1A MOSFET gate driver
  • 90μA typical start-up current, 125μA maximum
  • 35ns propagation delay current sense to output
  • Fast transient response with peak current-mode control
  • 9V to 13.2V operation
  • Adjustable switching frequency to 1MHz
  • 50ns rise and fall times with 1nF output load
  • Trimmed timing capacitor discharge current for accurate dead time/maximum duty cycle control
  • 1.5MHz bandwidth error amplifier
  • Tight tolerance voltage reference over line, load, and temperature
  • ±3% current limit threshold
  • Pb-free available (RoHS compliant)
  • Radiation environment:
  • High dose rate (50 - 300rad(Si)/s): 100krad(Si)
  • Low dose rate (0.01rad(Si)/s): 100krad(Si)*
    * Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate. (Applies to ISL7884xASEH only)

应用

  • Current mode switching power supplies
  • Isolated buck and flyback regulators
  • Boost regulators
  • Direction and speed control in motors
  • Control of high current FET drivers

产品选择

器件号 Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active SBDIP Tray 1
Availability
Active CFP Tray 1
Availability
Active SBDIP Tray 1 5962R0724901QPC
Availability
Active CFP Tray 1 5962R0724901QXC
Availability
Active SBDIP Tray 1 5962R0724901VPC
Availability
Active CFP Tray 1 5962R0724901VXC
Availability
Active 100 5962R0724901V9A
Availability
Active DIE 5
Availability

文档

文档标题 language 类型 文档格式 文件大小 日期
数据手册与勘误表
ISL78840ASEH, ISL78841ASEH, ISL78843ASEH, ISL78845ASEH ISL78840ASRH, ISL78841ASRH, ISL78843ASRH, ISL78845ASRH, ISL738840ASEH, ISL738841ASEH, ISL738843ASEH, ISL738845ASEH Datasheet 数据手册 PDF 927 KB
应用指南 & 白皮书
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
PCN / PDN
PCN11004 - Product Improvement - Design Change for Intersil Product ISL7884xARH / DSCC SMD 5962-07249 产品变更通告 PDF 194 KB
PCN10123 - Alternate Die Attach Material for Assembly of Intersil Hermetic Packaged Products - Intersil Palm Bay, FL. (ISP) 产品变更通告 PDF 230 KB
其他
Intersil Space Products Brochure 手册 PDF 3.14 MB
Intersil Commercial Lab Services 手册 PDF 364 KB
Standard Microcircuit Drawing 5962-07249 (ISL78840ASRH, ISL78841ASRH, ISL78843ASRH, ISL78845ASRH, ISL78840ASEH, ISL78841ASEH, ISL78843ASEH, ISL78845ASEH, ISL738840ASEH, ISL738841ASEH, ISL738843ASEH, ISL738845ASEH) 其他 0 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
PA11095 - Packing Method Change for Intersil 8-pin Ceramic Solder Seal Dual-In-Line (SBDIP) Packaged Products Product Advisory PDF 176 KB
PA11003 - Packing Method Change for Intersil TO-xx Metal Can and Flat Pack Packaged Products Product Advisory PDF 499 KB
ISL78845ASRH Total Dose Test Report 报告 PDF 322 KB
ISL78845ASEH Neutron Test Report 报告 PDF 370 KB
ISL78843ASRH, ISL78845ASRH SEE Test Report 报告 PDF 1.83 MB
ISL7884xASRH Flyback Application iSim:PE Model 原理图 SXSCH 161 KB

下载

文档标题 language 类型 文档格式 文件大小 日期
软件
iSim:PE Software v8.40 软件 EXE 157.43 MB
模型
ISL7884x PSPICE Model 模型 ZIP 30.70 MB

软件和工具页面

文档标题 类型 Description Company
iSim:PE Offline Simulation Tool Simulator iSim Personal Edition (iSim:PE) speeds the design cycle and reduces risk early in any project, identifying parts that can be used in current as well as next-generation designs. Renesas

新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月25日
Standard Data Package 基本页面 2020年3月19日
Rad Hard SMD Test Flow 基本页面 2020年3月19日
Rad Hard Test Reports 基本页面 2020年3月19日