The HS-303CEH is an analog switch and a monolithic device that is fabricated using the Renesas dielectrically isolated Radiation Hardened Silicon Gate (RSG) process technology to ensure latch-up free operation. The HS-303CEH is pinout compatible and functionally equivalent to the HS-303RH. The HS-303CEH offers low-resistance switching performance for analog voltages up to the supply rails. ON-resistance is low and stays reasonably constant across the full range of operating voltage and current. ON-resistance also stays reasonably constant when exposed to radiation. Break-before-make switching is controlled by 5V digital inputs. The HS-303CEH can operate with ±15V rails. Specifications See SMD 5962-95813 for detailed electrical specifications.


  • Electrically screened to DLA SMD# 5962-95813
  • QML, per MIL-PRF-38535
  • No latch-up, dielectrically isolated device islands
  • Pinout and functionally compatible with the HS-303RH series of analog switches
  • Analog signal range equal to the supply voltage range
  • Low leakage : 150nA (max, post-rad)
  • Low rON : 60Ω (max, post-rad)
  • Low standby supply current : ±150µA (max, post-rad)
  • Radiation assurance
    • High dose rate (50 to 300rad(Si)/s) : 100krad(Si)
    • Low dose rate (0.01rad(Si)/s) : 50krad(Si) (Note 1)
  • Single event effects
    • For LET = 60MeV·cm2/mg at 60° incident angle, <150pC charge transferred to the output of an off switch (based on SOI design calculations)


文档标题 language 类型 文档格式 文件大小 日期
star HS-303CEH Datasheet 数据手册 PDF 511 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
Intersil Space Products Brochure 手册 PDF 3.16 MB
Intersil Commercial Lab Services 手册 PDF 364 KB
Standard Microcircuit Drawing 5962-95813 (HS-307RH, HS-303AEH, HS-303ARH, HS-303BEH, HS-303BRH, HS-303CEH, HS-303RH, HS-390RH) 其他 0 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
HS-303CEH Neutron Test Report 报告 PDF 305 KB
R34ZZ0002: HS303xxH, HS-302AEH Design for Single Event Transients 技术摘要 PDF 115 KB