ISL28210

Precision Low Noise JFET Operational Amplifiers

Product Status: Mass Production

OVERVIEW

The ISL28110, ISL28210, are single and dual JFET amplifiers featuring low noise, high slew rate, low input bias current and offset voltage, making them the ideal choice for high impedance applications where precision and low noise are important. The combination of precision, low noise, and high speed combined with a small footprint provides the user with outstanding value and flexibility relative to similar competitive parts.

Applications for these amplifiers include precision medical and analytical instrumentation, sensor conditioning, precision power supply controls, industrial controls and photodiode amplifiers.

The ISL28110 single amplifier and the ISL28210 dual amplifiers are available in the 8 Ld SOIC package. All devices are offered in standard pin configurations and operate over the extended temperature range from -40°C to +125°C.

KEY FEATURES

  • Wide supply range: 9V to 40V
  • Low voltage noise: 6nV/√Hz
  • Input bias current: 2pA
  • High slew rate: 23V/µs
  • High bandwidth: 12.5MHz
  • Low input offset: 300µV, Max
  • Offset drift: Grade C 10µV/°C
  • Low current consumption: 2.55mA
  • Operating temperature range: -40°C to +125°C
  • Small package offerings in single, and dual
  • No phase reversal
  • Pb-Free (RoHS compliant)

BLOCK DIAGRAM

 Block Diagram

PARAMETRICS

Parameters
ISL28210
Basic Information
生产状态
Mass Production
器件/通道数量
2
带宽 (MHz)
12.5
压摆率 (V/μs)
23
VS (最小值)
9 V
VS (最大值)
40 V
IS (每放大器)
2.55 mA
噪声VN (nV/√Hz)
6
IBIAS
2 pA
IBIAS (最大值)
2 pA
最大失调电压
0.3 mV
IOUT
50 mA
VOUT (V)
39.2
轨到轨输入
No
轨到轨输出
No
PSRR (dB)
115
CMRR (dB)
100
热关断
No
增益最小值
1
AVOL (dB)
108
启用
No
资质级别
Standard
CAN 采样
YES
温度范围
-40 to +125

Below you will find information to support the development of your application.

You can find an explanation of orderable part numbers here.

Resources for Software and Hardware

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Hardware Design Support

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Simulation model Download SPICE parameters, IBIS models, and other simulation data.
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