Support is limited to customers who have already adopted these products.

The ISL75051SEH, ISL75051SRH are radiation hardened low-voltage, high-current, single-output LDOs specified for up to 3. 0A of continuous output current. These devices operate over an input voltage range of 2. 2V to 6. 0V and are capable of providing output voltages of 0. 8V to 5. 0V adjustable, based on resistor divider setting. Dropout voltages as low as 65mV can be realized using the device. The OCP pin allows the short-circuit output current limit threshold to be programmed by means of a resistor from the OCP pin to GND. The OCP setting range is from 0. 5A minimum to 8. 5A maximum. The resistor sets the constant current threshold for the output under fault conditions. The thermal shutdown disables the output if the device temperature exceeds the specified value. It subsequently enters an ON/OFF cycle until the fault is removed. The ENABLE feature allows the part to be placed into a low current shutdown mode that typically draws about 1μA. These devices are optimized for fast transient response and single event effects. This reduces the magnitude of SET seen on the output. Additional protection diodes and filters are not needed. These devices are stable with tantalum capacitors as low as 47μF and provide excellent regulation all the way from no load to full load. Programmable soft-start allows the user to program the inrush current by means of the decoupling capacitor value used on the BYP pin.


  • DLA SMD 5962-11212
  • Output current up to 3.0A at TJ = +150°C
  • Output accuracy ±1.5% over MIL temperature range
  • Ultra low dropout:
  • 65mV (typical) dropout at 1.0A
  • 225mV (typical) dropout at 3.0A
  • SET mitigation with no added filtering/diodes
  • Input supply range: 2.2V to 6.0V
  • Fast load transient response
  • Shutdown current of 1μA (typical)
  • Output adjustable using external resistors
  • PSRR 66dB (typical) at 1kHz
  • Enable and PGood feature
  • Programmable soft-start/inrush current limiting
  • Over-temperature shutdown and programmable OCP limits
  • Stable with 47μF min tantalum capacitor
  • Radiation environment
  • High dose rate (50-300rad(Si)/s): 100krad(Si)
  • Low dose rate (0.01rad(Si)/s): 100krad(Si)*
    *Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50 krad(Si) at low dose rate.


  • LDO regulator for space application
  • DSP, FPGA and µP core power supplies
  • Post-regulation of switched mode power supplies
  • Down-hole drilling


文档标题 language 类型 文档格式 文件大小 日期
star ISL75051SEH, ISL75051SRH Datasheet 数据手册 PDF 947 KB
AN1947: Intersil's Radiation Hardened Low Power FPGA Power Solutions 应用文档 PDF 304 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
Intersil Space Products Brochure 手册 PDF 3.16 MB
Intersil Commercial Lab Services 手册 PDF 364 KB
VIRTEX5MEZPWREV1Z User Guide 手册 - 开发工具 PDF 1.32 MB
ISL75051SRHEVAL1Z 手册 - 开发工具 PDF 916 KB
Standard Microcircuit Drawing 5962-11212 (ISL75051SEH, ISL75051SRH, ISL75051ASEH, ISL73051ASEH) 其他 0 KB
PAN17022 - Product Alert - ISL75051* / 5962-11212 RH Linear Regulator Product Alert Notice PDF 235 KB
PLC18009 - Q2 Standard EOL Notice Product Life Cycle Notice PDF 345 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report 报告 PDF 328 KB
ISL75051SEH Total Dose Test Report 报告 PDF 325 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report with Boeing 报告 PDF 308 KB
ISL75051SRH SEE Test Report 报告 PDF 1.28 MB
TB499: PCB Thermal Land Design for Ceramic Packages with Bottom Metal or Heat Sinks 技术摘要 PDF 410 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB


文档标题 language 类型 文档格式 文件大小 日期
ISL75051SRH-ISL73051ASEH PSPICE Model Model - Other ZIP 7 KB
Artwork files for the VIRTEX5MEZPWREV1Z Evaluation Board PCB设计文档 ZIP 328 KB
ISL75051SRHEVAL1Z Design Files PCB设计文档 ZIP 275 KB
Schematics for the VIRTEX5MEZPWREV1Z Evaluation Board PCB设计文档 PDF 98 KB
VIRTEX5MEZPWREV1Z Bill of Materials PCB设计文档 XLS 38 KB


类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月26日
Standard Data Package 基本页面 2020年3月20日
Rad Hard SMD Test Flow 基本页面 2020年3月20日
Rad Hard Test Reports 基本页面 2020年3月20日