| CAD Model: | View CAD Model |
| Pkg. Type: | WAFER |
| Pkg. Code: | DICEF |
| Lead Count (#): | |
| Pkg. Dimensions (mm): | 0.0 x 0.0 x 0.0 |
| Pitch (mm): |
| Moisture Sensitivity Level (MSL) | 1 |
| Pb (Lead) Free | Yes |
| ECCN (US) | EAR99 |
| HTS (US) | 8542.39.0090 |
| Lead Count (#) | 0 |
| Carrier Type | Wafer |
| Moisture Sensitivity Level (MSL) | 1 |
| Description | Die on Frame |
| Pkg. Dimensions (mm) | 0.0 x 0.0 x 0.0 |
| Qty. per Reel (#) | 0 |
| Pb (Lead) Free | Yes |
| Pb Free Category | e3 Sn |
| Temp. Range (°C) | -40 to +150°C |
| Country of Wafer Fabrication | TAIWAN |
| Adj. Analog Gain | 3 - 912 |
| Automotive Qual. | Yes |
| Function | Resistive SSC |
| Input Type | Single-bridge |
| Interface | I2C, Ratiometric Analog Voltage, ZACwire™ (OWI) |
| MOQ | 4580 |
| Pkg. Type | WAFER |
| Published | No |
| Qty. per Carrier (#) | 0 |
| Qualification Level | Automotive |
| Requires Terms and Conditions | Does not require acceptance of Terms and Conditions |
| Resolution (bits) | 18 |
| Sample Rate Max (KHz) | 10 |
| Supply Voltage (V) | 4.5 - 5.5 |
| Tape & Reel | No |
The RAA2S4251B is a member of Renesas’ family of CMOS integrated circuits for highly accurate amplification and sensor-specific correction of differential bridge sensor signals. Featuring a maximum analog pre-amplification of 900 with analog sensor offset correction (XSOC), the RAA2S4251B is adjustable to nearly all resistive bridges.
Conditioning calculation is accomplished via a 16-bit RISC microcontroller. Calibration coefficients and configuration data are stored in the nonvolatile memory (NVM), which is reliable in automotive applications.
Measured values are provided via a ratio-metric analog output signal. End-of-line calibration is also supported through this output pin via a One-Wire Interface (OWI). Digital calibration helps keep assembly cost low as no trimming by external devices or lasers is needed. The RAA2S4251B is optimized for harsh automotive environments by over-voltage and reverse polarity protection circuitry, excellent electromagnetic compatibility, and multiple diagnostic features.