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Automotive Sensor Signal Conditioner with Analog Output

Package Information

CAD Model: View CAD Model
Pkg. Type: WAFER
Pkg. Code: DICEF
Lead Count (#):
Pkg. Dimensions (mm): 0.0 x 0.0 x 0.0
Pitch (mm):

Environmental & Export Classifications

Moisture Sensitivity Level (MSL) 1
Pb (Lead) Free Yes
ECCN (US) EAR99
HTS (US) 8542.39.0090

Product Attributes

Lead Count (#) 0
Carrier Type Wafer
Moisture Sensitivity Level (MSL) 1
Description Die on Frame
Pkg. Dimensions (mm) 0.0 x 0.0 x 0.0
Qty. per Reel (#) 0
Pb (Lead) Free Yes
Pb Free Category e3 Sn
Temp. Range (°C) -40 to +150°C
Country of Wafer Fabrication TAIWAN
Adj. Analog Gain 3 - 912
Automotive Qual. Yes
Function Resistive SSC
Input Type Single-bridge
Interface I2C, Ratiometric Analog Voltage, ZACwire™ (OWI)
MOQ 4580
Pkg. Type WAFER
Published No
Qty. per Carrier (#) 0
Qualification Level Automotive
Requires Terms and Conditions Does not require acceptance of Terms and Conditions
Resolution (bits) 18
Sample Rate Max (KHz) 10
Supply Voltage (V) 4.5 - 5.5
Tape & Reel No

Description

The RAA2S4251B is a member of Renesas’ family of CMOS integrated circuits for highly accurate amplification and sensor-specific correction of differential bridge sensor signals. Featuring a maximum analog pre-amplification of 900 with analog sensor offset correction (XSOC), the RAA2S4251B is adjustable to nearly all resistive bridges.

Conditioning calculation is accomplished via a 16-bit RISC microcontroller. Calibration coefficients and configuration data are stored in the nonvolatile memory (NVM), which is reliable in automotive applications.

Measured values are provided via a ratio-metric analog output signal. End-of-line calibration is also supported through this output pin via a One-Wire Interface (OWI). Digital calibration helps keep assembly cost low as no trimming by external devices or lasers is needed. The RAA2S4251B is optimized for harsh automotive environments by over-voltage and reverse polarity protection circuitry, excellent electromagnetic compatibility, and multiple diagnostic features.