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Renesas Electronics Corporation
Radiation Hardened Dual, Non-Inverting Power MOSFET Drivers

Package Information

CAD Model:View CAD Model
Pkg. Type:CFP
Pkg. Code:KBT
Lead Count (#):16
Pkg. Dimensions (mm):7 x 10 x 2.92
Pitch (mm):1.27

Environmental & Export Classifications

Moisture Sensitivity Level (MSL)
Pb (Lead) FreeYes
ECCN (US)9A515.e.1
HTS (US)8542.39.0090
RoHS (HS9-4424BRH-T)EnglishJapanese

Product Attributes

Pkg. TypeCFP
Lead Count (#)16
Qualification LevelQML Class T (Space Lower Level)
Pkg. Dimensions (mm)7 x 10 x 2.92
DLA SMD5962R9956002TXC
Pb (Lead) FreeYes
MOQ450
Temp. Range (°C)-55 to +125°C
CAGE code34371
DSEE (MeV·cm2/mg)60
Die Sale Availability?Yes
Driver TypeLow Side
Drivers (#)2
FET TypeMOSFET
Fall Time75
FlowRH Hermetic
Input VCC (Max) (V)18
Input VCC (Min) (V)12
Lead CompliantNo
Length (mm)7
Low Side Fall Time (max) (ns)75
Low Side Rise Time (max) (ns)75
Output TypeNon-inverting
PROTO Availability?Yes
Peak Output Current IPK (A)2
Peak Output Sink Current (A)2
Peak Output Source Current (A)2
RatingSpace
Rise Time (Max)75
SMD URL5962-99560
TID HDR (krad(Si))300
Tape & ReelNo
Thickness (mm)2.92
Width (mm)10

Description

The radiation hardened HS-4424RH, HS-4424EH, HS-4424BRH and HS-4424BEH are non-inverting, dual, monolithic high-speed MOSFET drivers designed to convert TTL level signals into high current outputs at voltages up to 18V. The inputs of these devices are TTL compatible and can be directly driven by our HS-1825ARH PWM device or by our ACS/ACTS and HCS/HCTS type logic devices. The fast rise times and high current outputs allow very quick control of high gate capacitance power MOSFETs in high-frequency applications. The high current outputs minimize power losses in MOSFETs by rapidly charging and discharging the gate capacitance. The output stage incorporates a low voltage lockout circuit that puts the outputs into a three-state mode when the supply voltage drops below 10V for the HS-4424RH, HS-4424EH and 7.5V for the HS-4424BRH, HS-4424BEH. Constructed with the dielectrically isolated Rad Hard Silicon Gate (RSG) BiCMOS process, these devices are immune to single event latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments. Detailed Electrical Specifications for these devices are contained in SMD 5962-99560.