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OC-12/STM-4 AND OC-3/STM-1 CLOCK/DATA RECOVERY DEVICE

Package Information

CAD Model: View CAD Model
Pkg. Type: TSSOP
Pkg. Code: PGG20
Lead Count (#): 20
Pkg. Dimensions (mm): 6.5 x 4.4 x 1.0
Pitch (mm): 0.65

Environmental & Export Classifications

Moisture Sensitivity Level (MSL) 1
Pb (Lead) Free Yes
ECCN (US) EAR99
HTS (US) 8542.39.0090

Product Attributes

Lead Count (#) 20
Carrier Type Reel
Moisture Sensitivity Level (MSL) 1
Qty. per Reel (#) 3000
Qty. per Carrier (#) 0
Pb (Lead) Free Yes
Pb Free Category e3 Sn
Temp. Range (°C) -40 to 85°C
App Jitter Compliance STM-1 (OC-3/STS-3), STM-4 (OC-12/STS-12)
Core Voltage (V) 3.3
Divider Value 1, 4
Feedback Divider 1 - 1
Feedback Input No
Input Freq (MHz) 19.44 - 19.44
Input Type LVCMOS, LVDS, LVPECL
Inputs (#) 2
Length (mm) 6.5
MOQ 3000
Output Banks (#) 1
Output Freq Range (MHz) 155.52 - 155.52, 622.08 - 622.08
Output Signaling LVDS
Output Type LVDS
Output Voltage (V) 3.3
Outputs (#) 2
Package Area (mm²) 28.6
Pitch (mm) 0.65
Pkg. Dimensions (mm) 6.5 x 4.4 x 1.0
Pkg. Type TSSOP
Prog. Clock No
Published No
Reel Size (in) 13
Reference Output No
Requires Terms and Conditions Does not require acceptance of Terms and Conditions
Spread Spectrum No
Tape & Reel Yes
Thickness (mm) 1
VCO Max Freq (MHz) 621
VCO Min Freq (MHz) 622
Width (mm) 4.4

Description

The 894D115I-04 is a clock and data recovery circuit. The device is designed to extract the clock signal from a NRZ-coded STM-4 (OC-12/STS-12) or STM-1 (OC-3/STS-3) input data signal. The output signals of the device are the recovered clock and retimed data signals. Input and output are differential signals for best signal integrity and to support high clock and data rates. All control inputs and outputs are single-ended signals. An internal PLL is used for clock generation and recovery. An external clock input is provided to establish an initial operating frequency of the clock recovery PLL and to provide a clock reference in the absence of serial input data. The device supports a signal detect input and a lock detect output. A bypass circuit is provided to facilitate factory tests.